Portabele Measuring Microscope
It is widely used in spot inspecting and measuring in the factor
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This equipment can be used in observation, analysis and research of Metallurgy, Mineral, Crystal, Mi
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xjp-151 Portable metallurgical microscope is convenient for identify the structure of varius metals
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XJP-158J Metallurgical microscope is developed and aimed at the semiconductor industry, wafer manufa
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Specification
Model
XJP-401A
XJP-
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技术规格
型号
XJP-401A
XJP-401B
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This series microscope is widely used in observation & analysis of metallurgical organization in Mec
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XJP-405 industrial microscope is equipped with a large moving range mechanical stage, Epi-illumina
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XJP-407 Inverted Metallurgical Microscope is widely used in metallurgical structure analysis for Mec
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XJP-408 Up-right Metallurgical Microscope is applicable to the observation of transparent and opaque
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XJP-408 Up-right Metallurgical Microscope is applicable to the observation of transparent and opaque
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XJP-412J inverted bright & dark field metallurgical microscope is designed with infinite optical sys
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XJP-607 Industrial Metallurgical microscope is developed and aimed at the semiconductor industry, wa
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JP-607A industrial microscope is developed and aimed at the semiconductor industry, wafer manufact
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XJP-700J up-right bright & dark field metallurgical microscope is developed and aimed at the semicon
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