XJP-403J、403JT、403JA、403JAT

  • XJP-403J、403JT、403JA、403JAT
  • XJP-403J、403JT、403JA、403JAT

  • Model / 型 號: XJP-403J、403JT、403JA、403JAT
This series microscope is widely used in observation & analysis of metallurgical organization in Mechanical industry, Research of Geological & Mineral department and viewing & measuring crystal, integrate circuit, micro-electronics, etc in Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figure and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.
 
Specification
Model
XJP-403J
XJP-403JT
XJP-403JA
XJP-403JAT
Viewing head
Compensation Free Binocular Head. Inclined
at 45 ° ( 50mm -75mm )
 
 
Compensation Free Trinocular Head.
Inclined at 45 ° ( 50mm -75mm )
 
 
Eyepiece
WF10X/20mm
 
 
WF10X/ 22mm
 
 
WF10X/20mm with reticule 0.1mm
Nosepiece
Quadruple nosepiece
 
 
Quintuple nosepiece
 
 
Objective
195 metallurgical
objectives
4X/0.1W.D .25mm
 
 
10X/ 0.25W.D .11mm
20X/0.4W.D .9mm
40X/0.6W.D. 3.8mm
Infinity metallurgical
objectives
4X/0.1W.D .25mm
 
 
10X/ 0.25W.D .12mm
20X/0.4W.D .10mm
40X/0.6W.D. 7.1mm
50X/0.75W.D. 1.9mm 80 (S)X/0.9W.D. 0.9mm
Stage
Double layers mechanical stage
Stage size: 242mm × 172mm
Central stage: Φ110mm
Moving range: 75mm × 50mm
Focusing
Coaxial coarse & fine focusing adjustment  with
rack and pinion mechanism Fine focusing scale
Value 0.002mm
Illumination
Epi-Kohler illumination. With aperture
iris diaphragm and field iris diaphragm.
12V/30W.AC85V-230V Adjustable brightness
Filter
Blue, green, yellow
Polarizing outfit
Analyzer rotatable 360 ° ,polarizer & Analyzer
can be slided slided in / out of the optical path
Checking tool
0.01mm micrometer
Optional Accessory
1.3、2.0、3.0、5.0 Mega pixels CMOS electronic eyepiece
Photography attachmrnt